| 期刊ISSN: | 0923-8174 | ||
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| E-ISSN: | 1573-0727 | 期刊级别: | |
| 影响因子: | 1.1 | 检索数据库: | |
| 自引率: | 18.2% | 出版语言: | 英文 |
| 出版信息 | |
|---|---|
| 出版社 | Springer US |
| 期刊官网 | https://www.springer.com/10836 |
| 涉及的研究方向 | 工程技术、电子通信 |
| 年文章数 | 0 |
| 是否OA | 否 |
| APC费用 | |
| SCI期刊收录coverage | |
| 期刊简介 |
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The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.
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| 最新中科院SCI期刊分区 (基础版) |
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| 最新中科院SCI期刊分区 (升级版) |
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| Cite Score | Cite Score | SJR | SNIP | 排名 |
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